Allied High Tech MultiPrep System
The MultiPrep system is a precise polishing instrument which can be used to prepare a wide range of materials for optical, SEM, TEM, and AFM evaluation. Additional capabilities include parallel polishing, wedge polishing (TEM), and targeted material removal.
Buehler Ecomet 250
Basic Grinder/Polisher unit for surface preparation. Typically used to prepare materials for optical and SEM observation, hardness testing, tribological testing, etc…
Buehler Ecomet 250/Automet 250
Grinder/polisher unit with power head for semi-automatic preparation of multiple samples or larger samples which can mounted to large platen. Typically used for the preparation of smooth surfaces for optical and SEM analysis or other applications where surface finish must be controlled, such as prior to film deposition or for tribological testing of materials.
Triple Ion Beam Slope Cutter (Leica TIC3X)
The Triple Ion Beam Slope Cutter/Cross-sectional Polisher is an instrument for preparing stress free cross sections of hard to polish samples such as porous, brittle or heterogeneous samples for SEM, EDS, WDS, Auger, EBSD and AFM analysis. Cross sectional areas prepared by the milling process are on the order of a few mm square. The TIC3X is equipped with a cooling stage for processing heat sensitive materials.
Anton Paar MCR 302 Rheometer
The Anton Paar MCR302 Rheometer is used to characterize the flow properties of softer materials such as liquids and gels in response to a torsional deformation. Properties examined include viscosity, glass transition, curing, and rate dependent viscoelastic properties.Features:
Several parallel plate and cone and plate fixtures are available for use with the rheometer. In addition, double gap and concentric cylinder fixtures are available for characterization of very low viscosity fluids.
Dynamic Mechanical Analyzer, RSA-G2 Solids Analyzer
The TA Instruments RSA-G2 Solids Analyzer is capable of performing a range of mechanical testing measurements including dynamic mechanical analysis, creep and recovery, stress relaxation, stress ramp, strain rate ramps, iso-strain, iso-force, and fatigue as well as some user specified multi-wave test functions.Features:
Please see RSA-G2 brochure for full list of features.
Available accessories include:
- single and dual cantilever
- 3 point bending
Temperature range -150°C to 500°C.
Maximum load +/-35N.
Optotherm Micro Thermal Imaging System
The Micro thermal imaging system measures and displays the temperature distribution over the surface of small samples and devices. The enables quick detection of hot spots and thermal gradients.Features:
Lens Options available for use range from macroscope down to 5μm/pixel spatial resolution. Heating stage is available for heating up to 130°C. Thermal sensitivity 0.3°C.
Semetrol Deep Level Transient Spectroscopy System
Advanced semiconductor spectroscopy system.
- Deep Level Transient Spectroscopy and related methods.
- Thermal Admittance Spectroscopy
- Current-Voltage-Temperature Characterization
Thorlabs Ganymede Spectral Domain OCT imaging System
Optical Coherence Tomography is the optical equivalent of ultrasound. OCT provides 1D, 2D and 3D volumetric imaging. With the 900 nm laser of the GAN220C1 system, imaging depths of up to 1.9 mm in air and 1.4 mm in water are possible.
Mettler Toledo TGA/DSC3+ Simultaneous Thermal Analyzer
Simultaneous Thermal Analysis instrument for simultaneous TGA and DSC measurements. Temperature range to 1600°C.
TA Instruments DSC250
Differential Scanning Calorimetry. Measure temperature changes of a substance with respect to a reference temperature which occur during a controlled temperature program and in a defined gas atmosphere.
Nikon Eclipse MA200
Inverted light microscope with bright field, dark field, DIC and polarizing modes. Motorized stage for automated image stitching and z-stack (extended depth of field). NIS Elements Basic Research software package.
Olympus 3D Laser Scanning Confocal Microscope
The Olympus LEXT OLS5000 measuring laser microscope provides high resolution surface topography and shape analysis for a wide range of materials applications. The technique is non-contact, non-destructive and is capable of providing data over an extended volume (x, y and z). The microscope is equipped with both color imaging optics (white light microscopy) and laser confocal optics. The short wavelength laser (405nm) offers considerable improvements in lateral resolution (120nm in x and y) over white light microscopy. Depth resolution is ~4nm. Of particular interest to users is the ability to measure the shape and surface topography of transparent and highly reflective materials,the ability to measure film thickness and interface height with high resolution, and ability to characterize steep walls.Features:
The motorized stage allows for 3D measurements over an area 100mm X 100mm. Auto-focusing and long working distance lenses allow for overall height measurement in the tens of millimeters. With the extended frame, objects as tall as 210mm can be placed on the sample stage allowing researchers to place small experimental devices on the stage for imaging during testing. The quantifiable 3D surface measurement tools (such as line roughness, area roughness) available with the software are compliant with international standards.
Nikon Epiphot Inverted MicroscopyFeatures:
- Bright field/Dark field
- Polarizing observation mode
- Magnification 45 – 1500X
- Equipped with digital camera for image capture
Wild M3Z StereoscopeFeatures:
- Produces a spatial image of three-dimensional objects
- Magnification 65 – 600X
- Equipped with digital camera for image capture
Nikon Upright Microscope with Mettler Toledo FP82HT Hot Stage
The Mettler Toledo FP82 Hot Stage is used to observe the thermal behavior of a sample under a microscope. Heats to 375°C. Nikon microscope is equipped with camera for video (time versus temperature with image) capture.
Struers Accutom 5
Struers Accutom 5 precision cut-off machine.Features:
- positioning accuracy of 5 µm
- pre-set, constant feed speed (0.005 to 3 mm/sec)
- adjustable force limit
- variable cut-off wheel speed up to 3,000 rpm
Allied High Tech, Tech Cut 5
Multi-purpose precision sectioning saw.Features:
Multi-purpose precision sectioning saw. Multiple sample holder fixtures (vise, multi-purpose holder, double saddle, mount holder) are available for use with this saw to cut samples of varying configurations. An attachment for dicing 4″ Si wafer is also available. Saw accomodates blades with 1/2″ or 1.25″ arbor hole. A selection of abrasive blades and diamond blade are available for use with this saw.
Buehler Isomet Low Speed SawFeatures:
Precision, low speed (300 rpm) saw for small sample sectioning.
Rough cutting of larger ceramic pieces.
The LaboPress is a hot mounting device which applies heat and pressure to a sample placed in a cylinder within an appropriate resin. Hot mounting is desirable for superior edge retention and for preparing mounts which are uniform in size and shape.
The Struers Epovac is used for the mounting and impregnation of porous samples.
Struers Duramin 5
Microprocessor controlled hardness tester. Can be used with either Vickers or Knoop indenter.
Wilson Rockwell Hardness Tester
Carbolite High Temperature Tube Furnace
Carbolite CTF 17/300 High Temperature Tube Furnace (1700°C)Features:
- Maximum Temperature 1700°C
- Tube Length 650 mm
- Heated Length 300 mm
- Uniform Length 200 mm (+/- 5°C)
- Tube Diameter 76 mm
Blue M 48" Tube FurnaceFeatures:
- Maximum Temperature 1200°C
- Tube Diameter 57 mm
- Blue M Partlow Gray Box Furnace (50 – 350°C)
- Barnstead Thermolyne Small Box Furnace ( to 1100°C)
- Lindberg Hevi-Duty Box Furnace (200 – 1200°C)
- Blue M Box Furnace (800 – 1500°C)